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Multi75DLC Pin Mount SEM Specimen Holders Pelcotec™ CDMS Critical Dimension Magnification

SKU: 1689128407

4.8
USD307.40 USD339.40

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Ships within 48 hours · Estimated delivery Aug 5 - Aug 10

Description

Pelcotec™ CDMS Critical Dimension Magnification Standard

Width x Thickness 5029-2 Ceramic Tip Tweezer

Tip Geometry: Standard Tip Height: 10 - 15 Front Angle: 25+/-2 Back Angle: 15+/-2 Side Angle: 17

The MESP-V2 has a nominal coercivity of 400 Oe (medium)

high purity GE124 quartz

Multi75DLC Pin Mount SEM Specimen Holders Pelcotec™ CDMS Critical Dimension MagnificationDiamond Like Carbon Coated Force Modulation AFM Probe DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Diamond Like Carbon Coated Force Modulation AFM Probe Monolithic silicon AFM probe for force modulation and pulsed force mode (PFM). High durability and hydrophobicity due to Diamond Like Carbon coating on tip side of the cantilever. The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius

Exchange/Return Notes
  • We offer a 30-day return/exchange service after receiving.
  • Final sale items are not eligible for returns or exchanges.
  • To process your return/exchange, please contact us at [email protected]
  • Please click here for more details>>> Return & Exchange Policy

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