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and with specific angles ideally suited to accommodate specimens with small working distances in FIB
such as in microscopy and assembly applications
200nm Thermal Oxide on 10x10mm diced Ultra-Flat Wafer
ScanAsyst-Air-HR probes are specifically designed for use with the ScanAsyst-HR fast scanning accessory on the MultiMode 8 AFM
The soft and elastic handles are made of NBR vulcanized nitrile rubber and have a low surface resistivity of 108 – 109 Ohm
PELCO® Pin Stub Extender Grid Holder and with specific angles ideallyDESCRIPTION SEM Pin Mount Specimen Holders for Scanning Electron Microscopy A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3. 2mm (1 8") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain
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