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APSH-0040 CPII End radii are controlled to

SKU: 63223709422

4.3
USD288.55 USD334.55

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Ships within 48 hours · Estimated delivery Aug 13 - Aug 18

Description

End radii are controlled to 30nm +/- 15%

Innova probe cartridge for STM Mode DESCRIPTION

5 to 20 degrees)

Uncalibrated

3-Sided pyramidal diamond probe

APSH-0040 CPII End radii are controlled toCross Sectional Sample Holder DESCRIPTION The Cross Sectional Sample Holder, 0. 75" in diameter and 0. 26" tall, is used when the cross sectional surface of a sample is to be scanned. The cross sectional sample holder is included in the Scanning Capacitance Microscopy (SCM) option for Innova and CP II (Model PSSC 0100), but it is useful for Caliber and Dimension SPMs.

Exchange/Return Notes
  • We offer a 30-day return/exchange service after receiving.
  • Final sale items are not eligible for returns or exchanges.
  • To process your return/exchange, please contact us at [email protected]
  • Please click here for more details>>> Return & Exchange Policy

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