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Pelcotec™ G-1 Silicon Calibration Specimen - 1µm Pitch Mount:Mount P 54467 - Fine Point Diamond

SKU: 64062995253

4.7
EUR167.95 EUR188.95

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Ships within 48 hours · Estimated delivery Aug 2 - Aug 7

Description

54467 - Fine Point Diamond Scriber

Instructions included

TiOx substrate

Not intended for TEM grids

high contrast images easy to stigmate and use for checking resolution

Pelcotec™ G-1 Silicon Calibration Specimen - 1µm Pitch Mount:Mount P 54467 - Fine Point DiamondDESCRIPTION Includes 1m, 10m and 100m pitch The Pelcotec G 1 calibration specimen with a 1m pitch grid is very useful for magnification calibration or image distortion check in the 100x to 10,000x magnification range. Can be used for SEM, Auger, Sims, FIB, and LM (reflected light). Specimen may also be mounted directly on the Pelcotec G 1 which will give an accurate internal calibration in the image. Particularly useful when working with powders.

Exchange/Return Notes
  • We offer a 30-day return/exchange service after receiving.
  • Final sale items are not eligible for returns or exchanges.
  • To process your return/exchange, please contact us at [email protected]
  • Please click here for more details>>> Return & Exchange Policy

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