Carbon Mount 31.7mm, Cambridge S-4 SEM Specimen Mounts 2500nm tall spike with 30nm

2500nm tall spike with 30nm end radius and 150nm base width

Clip width is 6

PELCO® Silicon Nitride Support Films have no broken edges and are free from debris

Transmission 69%

Pin Mount adapter to JEOL 12

Carbon Mount 31.7mm, Cambridge S-4 SEM Specimen Mounts 2500nm tall spike with 30nmDESCRIPTION All our carbon SEM specimen mounts are made from spectrographically pure, the highest purity grade, graphite rods. Total impurity level does not exceed 2ppm and typically less than 1ppm per element. These mounts are ideal for analytical SEM and microprobe work since the only element which can be detected with EDS or WDS systems in their specimen mounts is C. Both electron and X ray absorption is much higher than compared with the standard